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The Art of Sample Preparation
The Art of Sample Preparation
Analysis Pathfinder: Make it work
The deposition of a thin Cr film on the surface of a needle-shaped specimen enables a stable yield for atom probe tomography (APT). During my master’s degree, I successfully acquired APT data of various oxides, ores, and glass materials.
Reference: https://doi.org/10.1093/mam/ozae006
To enable APT analysis of specimens too small for elaborate FIB milling and Pt deposition, I employed a technique that utilizes electrostatic attraction between the manipulator (EasyLift or OmniProbe) and the specimen to place it on the top of Si coupons.
Reference: https://doi.org/10.1017/S1431927621000465
Atom Probe Tomography
Atom Probe Tomography
Atomic-scale analysis of a wide range of materials
Independent Operation
Independent Operation
Analysis of composition, structure, kinetics and Imaging
Hitachi, SU5000
Hitachi, S-4300SE
Rigaku, SmartLab
Hitachi, STA200 Real-View
Focused Ion Beam for APT, TEM, Cross-sectional analysis
FEI, Nova NanoLab 600
FEI, Helios Nanolab 600
Thermo Fisher Scientific, Helios G4 UC
Atom Probe Tomography for atomic-scale characterization
LEAP 4000X HR
LEAP 6000 HR
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